ESTIMATION AND OPTIMAL DESIGN IN STEP PARTIALLY ACCELERATED LIFE TESTS FOR THE COMPOUND PARETO DISTRIBUTION USING TYPE-II CENSORING
By Ali A. Ismail, Abdalla A. Abdel-Ghaly and Eman H. El-Khodary.
This paper considers simple time-step-stress Partially Accelerated Life Testing (PALT) under compound distributions where the experiment is subject to type-II censoring. The time to failure is assumed to have a compound two-parameter Pareto lifetime distribution. Maximum likelihood estimators (MLE) of PALT model parameters are obtained. Also, confidence interval estimation of the parameters is presented. Moreover, optimum plans for simple time-step-stress PALT are developed. Such plans minimize the generalized asymptotic variance (GAV) of the MLE of the model parameters. For illustration, numerical examples are included.
Reliability; Pareto distribution; partial acceleration; stress level; maximum likelihood estimation; Fisher information matrix; optimal design; simple time-step stress tests; type-II censoring
Ali A. Ismail, firstname.lastname@example.org
Abdalla A. Abdel-Ghaly
Eman H. El-Khodary
Mohammed Ibrahim Ali Ageel,email@example.com
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