CUMULATIVE SUM CONTROL CHART FOR LOG –LOGISTIC DISTRIBUTION

by RRL Kantam and G.Srinivasa Rao.

Abstract: The sequential probability ratio procedures of Statistical Inference are made use of in construction of a Cumulative Sum Control Chart for a variable process characteristic. The distribution of process variate is log-logistic distribution. The construction of V mask and values of average run length are also presented. Such a chart is useful in early detection of shifts in the process average.

Key Words: Log-logistic distribution, cumulative sum control chart, V mask, sequential probability ratio test, Shewhart’s control chart, average run length

Authors:
R.R.L. Kantam, kantam_rrl@rediffmail.com
G. Srinivasa Rao, gaddesrao@yahoo.com

Editor: Chakraborty Subrata, subrata_arya@yahoo.co.in

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