Key Words: Log-logistic distribution, cumulative sum control chart, V mask, sequential probability ratio test, Shewhart’s control chart, average run length
R.R.L. Kantam, firstname.lastname@example.org
G. Srinivasa Rao, email@example.com
Editor: Chakraborty Subrata, firstname.lastname@example.org
READING THE ARTICLE: You can read the article in portable document (.pdf) format (55883 bytes.)
NOTE: The content of this article is the intellectual property of the authors, who retains all rights to future publication.
This page has been accessed 3239 times since July 24, 2006.