On the Optimal Design of Step-Stress Partially Accelerated Life Tests for the Gompertz Distribution with Type-I Censoring

by Ali A. Ismail.

Abstract: This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed that the lifetimes of test units follow a two-parameter Gompertz distribution and are type-I censored. Maximum Likelihood Estimates and asymptotic confidence intervals for model parameters are obtained. Also, optimum test plans for simple time-step stress test are developed. Finally, for illustration, simulation studies are carried out.

Key Words: Reliability, Gompertz distribution, partial acceleration, step-stress test, maximum likelihood estimation, Fisher information matrix, generalized asymptotic variance, Newton-Raphson method, optimum test plan, type-I censoring, Monte Carlo simulation

Author:
Ali A. Ismail, aismail100@yahoo.com

Editor: Samir K. Ashour, ashoursamir@hotmail.com

READING THE ARTICLE: You can read the article in portable document (.pdf) format (129965 bytes.)

NOTE: The content of this article is the intellectual property of the authors, who retains all rights to future publication.

This page has been accessed 374 times since July 24, 2006.

Return to the InterStat Home Page.