On the Optimal Design of Step-Stress Partially Accelerated Life Tests for the Gompertz Distribution with Type-I Censoring

by Ali A. Ismail.

Abstract: This paper studies simple time-step stress Partially Accelerated Life Tests (PALT). It is assumed that the lifetimes of test units follow a two-parameter Gompertz distribution and are type-I censored. Maximum Likelihood Estimates and asymptotic confidence intervals for model parameters are obtained. Also, optimum test plans for simple time-step stress test are developed. Finally, for illustration, simulation studies are carried out.

Key Words: Reliability, Gompertz distribution, partial acceleration, step-stress test, maximum likelihood estimation, Fisher information matrix, generalized asymptotic variance, Newton-Raphson method, optimum test plan, type-I censoring, Monte Carlo simulation

Ali A. Ismail, aismail100@yahoo.com

Editor: Samir K. Ashour, ashoursamir@hotmail.com

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